SEM (Scanning Electron Microscopy)

Scanning electron microscopy (SEM) also known as SEM microscopy is extensively used in micro and failure analysis of solid materials. With it’s high magnification and high resolution SEM measures smallest feature on the surface and produces clear image of it.


In SEM the image is formed by the collimated electron beam that strikes the surface of the specimen. SEM instrument has few electromagnetic lenses, couple of condenser lenses and objective lens. The condenser lens collimates the electron beam coming out from electron gun. Further objective lens focuses the beam on particular section which is to be scanned. The process of scanning the specimen with beam is called as rester scanning. The detector collects and amplifies the signal electron emitted by the specimen then reconstructs the image by correlating scanning point on specimen and picture point on screen. CRT converts the electronic signals to a visual display that gives us two dimensional image. The SEM can also perform on a selected point of the sample. This approach is adopted to identify chemical combination, crystalline structure and its orientation.

Machine Capability

* Make and Model:Zeiss, GeminiSEM 300


Magnification: 12x to 2,000,000x
* Resolution: 0.8 nm at 15 kV Inlens
* Bright & Dark field Imaging
* Acceleration voltage: 20 V to 30kV


– Inlense, SE, BSD
– EDS (Energy Dispersive x-ray Spectroscopy) for composition analysis
– High speed High Resolution EBSD detector
– TKD (Transmission Kikuchi Diffraction) facility is available and can be performed on TEM samples

Application Works